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排序方式: 共有1495条查询结果,搜索用时 15 毫秒
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《Ceramics International》2022,48(2):1814-1819
Sr3Al2-xBxO5Cl2:Eu2+, Dy3+ (x = 0, 0.2, 0.4) long persistent phosphors were prepared via solid-state process. The pristine Sr3Al2O5Cl2:Eu2+, Dy3+ phosphor exhibits orange/red broad band emission around 609 nm, which can be attributed to the electric radiation transitions 4f65 d1→4f7 of Eu2+. Upon the same excitation, the B3+-doped Sr3Al2-xBxO5Cl2:Eu2+, Dy3+ phosphors display red-shift from 609 nm to 625 nm with increasing B3+ concentrations. The XRD patterns show that Al3+ can be replaced by B3+ in the host lattice at the tetrahedral site, which causes lattice contraction and crystal field enhancement, and thereafter achieves the red-shift on the emission spectrum. The XPS investigation provides direct evidence of the dominant 2-valent europium in the phosphor, which can be ascribed for the broad band emission of the prepared phosphors. The afterglow of all phosphors show standard double exponential decay behavior, and the afterglow of Sr3Al2O5Cl2:Eu2+, Dy3+is rather weak, while the sample co-doped with B3+shows longer and stronger afterglow, as confirmed after the curve simulation. The analysis of thermally stimulated luminescence showed that, when B3+ is introduced, a much deeper trap is created, and the density of the electron trap is also significantly increased. As a result, B3+ ions caused redshift and enhanced afterglow for the Sr3Al2-xBxO5Cl2:Eu2+, Dy3+ phosphor. 相似文献
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前向反冲分析和非卢瑟福背散射 总被引:1,自引:0,他引:1
赵国庆 《理化检验(物理分册)》2002,38(2):88-91
介绍了弹性散射分析中的另外两种分析方法——前向反冲分析和非卢瑟福背散射分析。前向反冲分析适用于材料中H和He同位素分析。高能质子和He离子背散射分析可提高对重基体中C,N和O等轻元素分析的灵敏度。给出了这两种分析方法的应用实例。 相似文献
5.
Motofumi Suzuki Kohei Kinoshita Shinji Jomori Hidehiko Harada Kaoru Nakajima Kenji Kimura 《Thin solid films》2007,515(22):8281-8284
The initial stage of iron silicide formation is investigated by high-resolution Rutherford backscattering spectroscopy. During the Fe deposition on Si(001) at 470 °C, the formation of FeSi2 is confirmed by the surface peak analysis. Initially, FeSi2 grows epitaxially so that one of the major crystallographic axes is parallel to the <111> axis of the Si substrate. With increasing Fe deposition, the deviation between the major crystallographic axis of the silicide region and Si<111> increases although the electron diffraction pattern is independent of the amount of Fe deposition. Therefore, the subsurface crystallographic structure of iron silicide is transformed from a cubic-like to a low-symmetry structure. 相似文献
6.
The thermal stability of interfaces between metals (Ni, Pt, Ti, Mo) and III-V compound semiconductors has been investigated
by the application of Rutherford backscattering spectrometry. Metal diffusion and interfacial lattice disorder of the semiconductors
were analyzed for various metal/semiconductor samples annealed at temperatures up to 500°C. The interfaces of Ni/GaAs and
Ti/GaAs were found to be more stable than those of Ni/In-based semiconductors and Ti/ In-based semiconductors, respectively.
Faster diffusion of Pt atoms was ob-served in In-and As-containing materials than in P-containing materials. Mo/ semiconductor
interfaces were the most stable. 相似文献
7.
Nd:碲酸盐玻璃的光谱和激光性质 总被引:2,自引:0,他引:2
对比了各种激光玻璃的光谱性质,指出碲酸盐玻璃是一咱理想的激光介质,并资产在室温下实现了钛宝石激光器泵浦了Nd:碲酸盐块体玻璃的激光发射,激光阈值4.20mJ,斜率效率14.7%。 相似文献
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A. Edwards Mulpuri V. Rao B. Molnar A. E. Wickenden W. Holland P. H. Chi 《Journal of Electronic Materials》1997,26(3):334-339
Doping by ion implantation using Si, O, Mg, and Ca has been studied in single crystal semi-insulating and n-type GaN grown
on a-sapphire substrates. The n-and p-type dopants used in this study are Si and O; Mg and Ca, respectively. Room temperature
activation of Si and O donors has been achieved after 1150°C annealing for 120 s. The activation of Mg and Ca acceptors is
too low to measure at both room temperature and 300°C. Using higher doses to achieve a measurable p-type conduction increases
the amount of damage created by the implantation. Rutherford back scattering measurements on this material indicate that the
damage is still present even after the maximum possible heat treatment. Secondary ion mass spectrometry measurements have
indicated a redistribution in the measured profiles of Mg due to annealing. 相似文献
10.
A. Kadashchuk A. Andreev H. Sitter N.S. Sariciftci Y. Skryshevski Y. Piryatinski I. Blonsky D. Meissner 《Advanced functional materials》2004,14(10):970-978
We report on photoluminescence (PL) and thermally stimulated luminescence (TSL) in highly ordered nanostructures of para‐sexiphenyl (PSP) grown by hot wall epitaxy (HWE). A low‐energy broad band is observed in the PL spectra that can be attributed to the emission from molecular aggregates. While the intrinsic exciton emission in steady‐state PL dominates at low temperatures, the emission from aggregates increases with elevating temperature and its magnitude depends sensitively on film preparation conditions. Time‐resolved PL measurements showed that the aggregate emission decays with a life‐time of ≈ 4 ns, which is approximately an order of magnitude larger than the lifetime of singlet excitons. TSL data suggests the presence of an energetically disordered distribution of localized states for charge carriers in PSP films, which results from an intrinsic disorder in this material. A low‐temperature TSL peak with the maximum at around 30 K evidences for a weak energy disorder in PSP films, and has been interpreted in terms of a hopping model of TSL in disordered organic materials. 相似文献