Growth study of AlGaAs using dimethylethylamine alane as the aluminum precursor

We present a comprehensive study on the growth of AlGaAs by using an alternative Al precursor, dimethylethylamine alane (DMEAA), and a Ga coprecursor, either triethylgallium (TEG) or trimethylgallium (TMG). The growth rate of AlAs determined by using in situ reflectometry was studied as a function of the growth temperature, V/III ratio, growth pressure, and rotation speed of the substrate. The presence of gas phase reactions of DMEAA with arsine and TEG was indicated, and their reduction was achieved at a lower growth pressure, lower V/III ratio, or a lower growth temperature. Negligible pre-reaction of DMEAA with TMG was observed. Excellent material uniformity of AlGaAs was achieved on a 2″ diameter wafer. Secondary ion mass spectroscopy measurements revealed extremely low C and O contents in the AlAs layer grown by DMEAA. Photoluminescence measurements suggested the presence of some non-radiative defects in the as-grown DMEAA AlGaAs layers.     

Growth of AlxGa1−x as by metalorganic chemical vapor deposition using trimethylgallium and trimethylamine alane

High-quality Al_xGa_1−xAs layers with aluminum arsenide contentx up to 0.34 have been grown in a low pressure metalorganic chemical vapor deposition (MOCVD) system using trimethylgallium (TMG), trimethylamine alane (TMAA) and arsine. The carbon content in these films depended on growth conditions but was in general lower than in those obtained with trimethylaluminum (TMA) instead of TMAA in the same reactor under similar conditions. Unlike TMA grown layers, the TMAA grown Al_xGa_1−xAs layers, (grown at much lower temperature—down to 650° C), exhibited room temperature photolu-minescence (PL). Low temperature (25 K) PL from these films showed sharp bound exciton peaks with a line width of 5.1 meV for Al_0.25Ga_0.75As. A 39 period Al_0.28Ga_0.72As (5.5 nm)/GaAs (8.0 nm) superlattice grown at 650° C showed a strong PL peak at 25 K with a line width of 5.5 meV attesting to the high quality of these layers.     

Chemical vapor deposition of aluminum from methylpyrrolidine alane complex

Chemical vapor deposition of aluminum from a recently developed precursor, methylpyrrolidine alane complex, has been studied. Aluminum films deposited on conducting surfaces (titanium nitride, copper, gold), but not on insulating surfaces (silicon, silicon dioxide, glass) at low substrate temperatures, showing deposition selectivity, while the deposition selectivity was lost at high substrate temperatures (> 210 °C). Al deposition rates on TiN and Cu were very close, but much higher than on Au. Deposition rates on all conducting substrates increased with the temperature and reached maximum at 180 °C. Al films deposited on as-sputtered TiN or Cu have no preferred orientations. Al–Au alloys and intermetallics were observed in the films deposited on Au. Surface morphology observation revealed that the film growth on TiN or Cu is different from that on Au. The surface roughness of Al films increased with the deposition time or the film thickness.     

Effect of substrate on the nucleation and growth of aluminum films deposited from methylpyrrolidine alane

Methylpyrrolidine alane complex was used to deposit aluminum films on various types of substrates in a low pressure chemical vapor deposition reactor. The films grow easily on metallic and transition metal oxide surfaces, but not on any other tested semiconductor and dielectric substrates below 200 °C, showing strong substrate dependency. The free energies of precursor adsorption, surface dissociation reaction and product desorption, as well as the film wettability to substrate are among the key factors which affect the energy barrier for nucleation or deposition selectivity. In general, a metal substrate can enhance nucleation because it catalyzes the surface reactions and bonds strongly with aluminum. The oxidation-reduction reaction may occur between the precursor and substrate on a metal oxide surface. The reduced metal sites can be the seed nuclei and are possibly responsible for Al growth on the surfaces of transition metal oxides.     

Vibrational Spectroscopic Studies of Alane

ABSTRACT

Alane has been subjected to Raman studies under static compression. The Raman spectra showed four modes, which increased in frequency as pressure was increased from ambient to 6.6 GPa. From the pressure dependence, the pressure coefficient, dν_i/dP, for each mode has been estimated and used to evaluate the mode Grüneisen parameter γ_i for that mode. Independently the thermodynamic Grüneisen parameter γ_th has also been calculated using the pressure derivative of the isothermal bulk modulus value from the literature. Preliminary infrared spectra were also collected under ambient conditions and are discussed with those reported in the literature for alane polymorphs.