TiO2/MXene-Assisted LDI-MS for Urine Metabolic Profiling in Urinary Disease

Cancer remains an intractable medical problem. Rapid diagnosis and identification of cancer are critical to differentiate it from nonmalignant diseases. High-throughput biofluid metabolic analysis has potential for cancer diagnosis. Nevertheless, the present metabolite analysis method does not meet the demand for high-throughput screening of diseases. Herein, a high-throughput, cost-effective, and noninvasive urine metabolic profiling method based on TiO₂/MXene-assisted laser desorption/ionization mass spectrometry (LDI-MS) is presented for the efficient screening of bladder cancer (BC) and nonmalignant urinary disease. Combined with machine learning, TiO₂/MXene-assisted LDI-MS enables high diagnostic accuracy (96.8%) for the classification of patient groups (including 47 BC and 46 ureteral calculus (UC) patients) from healthy controls (113 cases). In addition, BC patients can also be identified from noncancerous UC individuals with an accuracy of 88.3% in the independent test cohort. Furthermore, metabolite variations between BC and UC individuals are investigated based on relative quantification, and related pathways are also discussed. These results suggest that this method, based on urine metabolic patterns, provides a potential tool for rapidly distinguishing urinary diseases and it may pave the way for precision medicine.     

Suitable test structures for submicron ion beam analysis

For the precise determination of the sizes of submicron beam spots test structures with an excellent edge definition are required. For this purpose a semiconductor heterostructure consisting of an 1.62 μm GaInP epi-layer grown on (0 0 1) GaAs has been made, which provides atomically sharp edges for beam spot size measurements. Since the sample has been thinned down by standard transmission electron microscope (TEM) preparation techniques, it can be used for both PIXE and STIM. The sample has been investigated with a TEM and the ion nanoprobe LIPSION. A one-dimensional beam profile in the low current mode was determined by a STIM measurement using 2 MeV protons and yielded a FWHM of (41±4) nm, which is the smallest value reported so far for high energy nuclear micro- and nanoprobes. Furthermore we present nickel nanowhiskers produced at the GSI Darmstadt by electrochemical preparation of etched ion track membranes that have been used to obtain two-dimensional images of the shapes of submicron beam spots. For these measurements a scan over a single nickel nanowhisker having a diameter of 220 nm and a height of about 6 μm was performed.     

Studies on nucleation kinetics of InxGa1−xN/GaN heterostructures

Nucleation kinetics during the growth of In_xGa_1−xN on a GaN substrate have been studied. The behavior of nonequilibrium between the In_xGa_1−xN and the GaN substrate has been analyzed, and hence, the expression derived for the stress-induced supercooling/superheating has been numerically evaluated. The maximum amount of stress-induced supercooling is found to be 1.017 K at x=0.12. These values are incorporated in the classical heterogeneous nucleation theory. Using the regular solution model, the interfacial tension between the nucleus and substrate and, hence, the interfacial tension between nucleus and mother phase and thermodynamical potential of the compounds have been calculated. The amount of driving force available for the nucleation has been determined for different compositions and degrees of supercooling. It has been shown that the value of the interaction parameter of InN-GaN plays a dominant role in nucleation and growth kinetics of In_xGa_1−xN on a GaN substrate. These values have been used to evaluate the nucleation parameters. It is shown that the nucleation barrier for the formation of a In_xGa_1−xN nucleus on a GaN substrate is minimum in the range of x=0.12 to x=0.17, and it has been qualitatively proved that good quality In_xGa_1−xN on GaN can be grown only in the range 0<x≤0.2.     

Energy relaxation in GaInAs/AlInAs heterojunctions and GaAs/AlGaAs multiple quantum wells

We have studied electron energy relaxation in GaInAs/AlInAs heterojunctions and GaAs/AlGaAs multiple quantum wells using mobility measurements as a function of electric field and temperature, in the range 3K to 300K. The results in the range 3 to 20K show a power loss rate which is dependent on (T_e − T_l), suggesting that the energy relaxation occurs through acoustic phonon scattering. At electron temperatures greater than 20K, the experimental results are modelled using a standard expression for polar optical phonons. This modelling yields 30meV and 31meV for the polar optical phonon energy in GaAs and InGaAs respectively.     

具有界面依赖光致发光的双层WS2/Ga2O3异质结的能带工程(英文)

利用垂直WS₂/Ga₂O₃异质结构中异质界面诱导了反常的光致发光(PL)发射。垂直堆栈的WS₂/Ga₂O₃异质界面使其形成了II型能带结构,导致与Ga₂O₃层接触的底层WS₂的PL强度下降。而异质界面的强耦合作用也影响了双层WS₂中的同质层间相互作用,使得上层WS₂出现反常的PL增强。这种堆栈新型二维异质结构为定制目标能带结构并控制其光子和电子行为提供一种新的手段。     

Near‐Infrared Photodetectors Based on MoTe2/Graphene Heterostructure with High Responsivity and Flexibility

2D transition metal dichalcogenides (TMDCs) have attracted considerable attention due to their impressively high performance in optoelectronic devices. However, efficient infrared (IR) photodetection has been significantly hampered because the absorption wavelength range of most TMDCs lies in the visible spectrum. In this regard, semiconducting 2D MoTe₂ can be an alternative choice owing to its smaller band gap ≈1 eV from bulk to monolayer and high carrier mobility. Here, a MoTe₂/graphene heterostructure photodetector is demonstrated for efficient near‐infrared (NIR) light detection. The devices achieve a high responsivity of ≈970.82 A W^?1 (at 1064 nm) and broadband photodetection (visible‐1064 nm). Because of the effective photogating effect induced by electrons trapped in the localized states of MoTe₂, the devices demonstrate an extremely high photoconductive gain of 4.69 × 10⁸ and detectivity of 1.55 × 10¹¹ cm Hz^1/2 W^?1. Moreover, flexible devices based on the MoTe₂/graphene heterostructure on flexible substrate also retains a good photodetection ability after thousands of times bending test (1.2% tensile strain), with a high responsivity of ≈60 A W^?1 at 1064 nm at V _DS = 1 V, which provides a promising platform for highly efficient, flexible, and low cost broadband NIR photodetectors.     

AlxGa1-xN/GaN异质结构中二维电子气的磁致子带间散射效应

通过在低温和强磁场下的磁输运测量研究了非故意掺杂Al0．22Ga0.78N／GaN异质结二维电子气(2DEG)的磁电阻振荡现象。观察到了磁致子带间散射(MIS)效应。在极低温下观察到了表征两个子带被2DEG占据的双周期舒勃尼科夫一德哈斯(SdH)振荡。实验观察到MIS效应引起的磁电阻振荡的幅度随温度上升略有减小，振荡的频率为两个子带SdH振荡频率之差。随着温度的升高，MIS振荡成为主要的振荡。由于SdH振荡和MIS振荡对温度的依赖关系不同，实验观察到SdH和MIS振荡之间的调制在温度10和17K之间最为强烈，其它温度下的调制很弱。     

Au/Ni/Al/Ti/AlxGa1-xN/GaN和Au/Pt/Al/Ti/AlxGa1-xN/GaN欧姆接触研究

研究并对比了Ti/Al/Ni/Au和Ti/Al/Pt/Au多层金属膜与未掺杂的Al0 .2 2 Ga0 .78N/GaN(i AlGaN/GaN)异质结构之间的欧姆接触性质。在退火温度低于 70 0℃时 ,两种接触样品上都不能得到欧姆接触。随着退火温度的升高 ,85 0℃快速退火后 ,在Ti/Al/Ni/Au接触上获得了 1.2 6×10 - 6 Ω·cm2 的比接触电阻率 ,在Ti/Al/Pt/Au接触上获得了 1.97× 10 - 5Ω·cm2 的比接触电阻率。研究结果表明 ,金属与半导体接触界面和Al0 .2 2 Ga0 .78N异质结构界面载流子沟道之间适当的势垒的存在对高质量欧姆接触的形成起重要作用 ,势垒的宽度取决于退火温度以及退火的具体进程。对Ti/Al/Ni/Au和Ti/Al/Pt/Au欧姆接触比接触电阻率的差异进行了解释。     

Ionic conductivity in oxide heterostructures: the role of interfaces

Abstract

Rapidly growing attention is being directed to the investigation of ionic conductivity in oxide film heterostructures. The main reason for this interest arises from interfacial phenomena in these heterostructures and their applications. Recent results revealed that heterophase interfaces have faster ionic conduction pathways than the bulk or homophase interfaces. This finding can open attractive opportunities in the field of micro-ionic devices. The influence of the interfaces on the conduction properties of heterostructures is becoming increasingly important with the miniaturization of solid-state devices, which leads to an enhanced interface density at the expense of the bulk. This review aims to describe the main evidence of interfacial phenomena in ion-conducting film heterostructures, highlighting the fundamental and technological relevance and offering guidelines to understanding the interface conduction mechanisms in these structures.     

相场法模拟GaAs衬底上InGaAs异质结表面形貌

本工作采用相场法模拟GaAs衬底上生长的In_(0.3)Ga_(0.7)As多层异质结构薄膜表面。通过引入多序参量,使用半隐性傅里叶谱方法求解Cahn-Hilliard方程可以求得带缓冲层结构的薄膜表面形貌。计算结果模拟了薄膜生长过程,研究显示,使用In0.15-Ga0.85As缓冲层,厚度从1nm增加到4nm,薄膜表面临界波长从34nm提升到80nm。随着缓冲层的厚度从1nm增加到10nm,使用正弦波表面的模拟结果显示,薄膜表面粗糙度从2.87nm下降到0.43nm,随机叠加波表面的模拟结果也类似,表面粗糙度从1.21nm下降到0.18nm。热力学分析和应变分布分析可以解释缓冲层对薄膜表面形貌演化的作用。该模拟计算方式对设计缓冲层结构有很大的帮助,模拟计算的结果可以与实验相比对。