首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   1538篇
  免费   330篇
  国内免费   60篇
电工技术   14篇
综合类   18篇
化学工业   161篇
金属工艺   30篇
机械仪表   29篇
矿业工程   1篇
能源动力   51篇
轻工业   3篇
无线电   672篇
一般工业技术   912篇
冶金工业   5篇
原子能技术   7篇
自动化技术   25篇
  2024年   2篇
  2023年   80篇
  2022年   10篇
  2021年   62篇
  2020年   82篇
  2019年   81篇
  2018年   83篇
  2017年   101篇
  2016年   80篇
  2015年   87篇
  2014年   122篇
  2013年   109篇
  2012年   125篇
  2011年   120篇
  2010年   82篇
  2009年   93篇
  2008年   109篇
  2007年   94篇
  2006年   52篇
  2005年   55篇
  2004年   19篇
  2003年   51篇
  2002年   29篇
  2001年   23篇
  2000年   20篇
  1999年   13篇
  1998年   13篇
  1997年   16篇
  1996年   19篇
  1995年   12篇
  1994年   4篇
  1993年   7篇
  1992年   8篇
  1991年   7篇
  1990年   16篇
  1989年   8篇
  1988年   8篇
  1987年   3篇
  1986年   3篇
  1985年   3篇
  1984年   5篇
  1983年   1篇
  1982年   1篇
  1981年   3篇
  1980年   1篇
  1979年   1篇
  1978年   2篇
  1976年   1篇
  1975年   2篇
排序方式: 共有1928条查询结果,搜索用时 15 毫秒
1.
We report a method to produce magnetic nanostructured semiconductor films based in ZnO doped with Nickel to control their magnetic properties. The method is based on a combined diffusion–oxidation process within a controlled atmosphere chamber to produce a uniform distribution of Ni ions in the ZnO films (ZnO:Ni). The synthesis of ZnO:Ni films is reported as well as the magnetoresistive characteristics, the used method yields films with reproducible and homogeneous properties. The films were also characterized structurally by X-Ray Diffraction (XRD) and Raman spectroscopy, and by Hall–van der Pauw measurements. The XRD measurements confirm the nanocrystalline films character. The films resulted of n-type conductivity with electron concentrations of ~1020 cm−3 in average and carrier mobilities of 5 cm2/V s. The Magnetoresistance (MR) behavior of the films at 300 K shows negative changes of ΔR~0.5% in accordance with the usual literature reports on samples produced by other methods.  相似文献   
2.
Light-emitting field effect transistors (LEFETs) are a class of organic optoelectronic device capable of simultaneously delivering the electrical switching characteristics of a transistor and the light emission of a diode. We report on the temperature dependence of the charge transport and emissive properties in a model organic heterostructure LEFET system from 300 K to 135 K. We study parameters such as carrier mobility, brightness, and external quantum efficiency (EQE), and observe clear thermally activated behaviour for transport and injection. Overall, the EQE increases with decreasing temperature and conversely the brightness decreases. These contrary effects can be explained by a higher recombination efficiency occurring at lower temperatures, and this insight delivers new knowledge concerning the optimisation of both the transport and emissive properties in LEFETs.  相似文献   
3.
Abstract

In this work, a new g-C3N4-based Z-scheme with γ-Fe2O3 and β-Ag2Se both n-type semiconductors, and graphite to favor electron exchange is presented. The composite material was studied by XRD, FTIR, UV-Vis, TEM, XPS, TGA, DSC and TOF-SIMS, and the ability of this photocatalytic system to act as a photo-reductant was assessed using crystal violet (CV+) dye. Solar light driven photo-reduction of CV+ in the presence of tri-sodium citrate evidenced a synergistic enhancement of the activity of the composite toward reduction, with ~20 times higher conversion rates per unit of surface area than those of g-C3N4. Photo-oxidation experiments under Xe lamp irradiation in the presence of H2O2 also showed that the AgFeCN composite featured a higher activity (~8×) than g-C3N4. This Z-scheme may deserve further study as a photo-reductant to obtain hydrogen or hydrogenated compounds. Moreover, the use of CV+ may represent a facile procedure that can aid in the selection of new photocatalysts to be used in hydrogen production.  相似文献   
4.
Magnetic effects of direct ion implantation of Mn and Fe into p-GaN   总被引:3,自引:0,他引:3  
In p-GaN implanted with Mn (3×1016 cm−2 at 250 keV), the material after annealing shows ferromagnetic properties below 250 K. Cross-sectional transmission electron microscopy (TEM) revealed the presence of platelet structures with hexagonal symmetry. These regions are most likely GaxMn1−xN, which produce the ferromagnetic contribution to the magnetization. In p-GaN implanted with Fe, the material after annealing showed ferromagnetic properties at temperatures that were dependent on the Fe dose, but were below 200 K in all cases. In these samples, TEM and diffraction analysis did not reveal any secondary phase formation. The results for the Fe implantation are similar to those reported for Fe doping during epitaxial growth of GaN.  相似文献   
5.
A thermodynamic modeling of GaN was carried out to describe the thermodynamic behavior of native defects, dopants, and carriers (free electrons and holes) in GaN semiconductors. The compound energy model (CEM) was used. An unintentionally doped GaN was taken as an example. Oxygen was introduced into the model as the unintentionally doped impurity, according to the practical experimental phenomena. The energies of component compounds in the model were defined based on the results of the ab initio calculations and adjusted to fit experimental data. The thermodynamic properties of the defects and the oxygen doped were calculated to show the facility of the model.  相似文献   
6.
The technique of high pressure is utilized to study the carrier transport behaviour in doped and undoped bulk amorphous (GeSe3·5)100−x Bi x (x=0, 2, 4, 10) down to liquid nitrogen temperature to observe impurity induced modifications in amorphous semiconductors. It is observed that pressure induced effects in lightly doped (2 at % Bi) and heavily doped (x=4, 10) semiconductors are markedly different. Results are discussed in view of the incorporation behaviour of the bismuth impurity.  相似文献   
7.
Variable-magnetic-field Hall measurements (0 to 1.5 T) are performed on very-narrow-gap bulk-grown Hg1−xCdxTe single crystals (0.165 ≤ x ≤ 0.2) at various temperatures (10 to 300K). The electron densities and mobilities are obtained within the one-carrier (electrons) approximation of the reduced-con-ductivity-tensor scheme. The present data together with the selected data set reported by other workers exhibit a pronounced peak when the electron mobility is plotted against the alloy composition x-value which has been predicted to be due to the effective-mass minimum at the bandgap-crossing (Eg ≈ 0). The observed position (x ≈ 0.165), height (≈4 x 102 m2Vs), and width (≈0.01 in x) of the mobility-peak can be explained by a simple simulation involving only ionized-impurity scattering. A lower bound of the effective mass is introduced as a fitting parameter to be consistent with the finiteness of the observed electron mobility and is found to be of the order of 10−4 of the mass of a free electron.  相似文献   
8.
湿敏半导体材料电导率计算方法的研究   总被引:3,自引:0,他引:3  
胡一帆  王豫 《功能材料》1994,25(3):255-257
结合修正了的耗尽层理论和多孔湿敏半导体的特点,本文提出了一个简单的物理模型作为n型湿敏半导体特征的一级近似。描述了多孔湿敏半导体的导电机理,并给出了湿度与宏观电导率的关系。  相似文献   
9.
In this paper, we present the theory for calculating Raman line shapes as functions of the Fermi energy and finite temperatures in zinc blende, n-type GaAs for donor densities between 1016 cm−3 and 1019 cm−3. Compared to other theories, this theory is unique in two respects: 1) the many-body effects are treated self-consistently and 2) the theory is valid at room temperature for arbitrary values of the ratio R = (Q2/α), where Q is the magnitude of the normalized wave vector and α is the normalized frequency used in the Raman measurements. These calculations solve the charge neutrality equation self-consistently for a two-band model of GaAs at 300 K that includes the effects of high carrier concentrations and dopant densities on the perturbed densities of states used to calculate the Fermi energy as a function of temperature. The results are then applied to obtain the carrier concentrations from Fermi energies in the context of line shapes in Raman spectra due to the coupling between longitudinal optical phonons and plasmons. Raman measurements have been proposed as a non-destructive method for wafer acceptance tests of carrier density in semiconductor epilayers. The interpretation of Raman spectra to determine the majority electron density in n-type semiconductors requires an interdisciplinary effort involving experiments, theory, and computer-based simulations and visualizations of the theoretical calculations.  相似文献   
10.
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号