Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary

This paper is a report on the effect of a single perpendicular grain boundary on the hot-carrier and high current stability in high performance polycrystalline silicon (poly-Si) thin film transistors (TFTs). Under a hot carrier stress condition (Vg = Vth + 1 V, Vd = 12 V), the poly-Si TFT with a single grain boundary is superior to the poly-Si without any grain boundary because of the smaller free carriers available for electric conduction. The shift of transconductance in poly-Si TFT with a single grain boundary is less than 5% after hot carrier stress during a period of 1000 s. The shift of transconductance is about 25% in the case of the poly-Si TFTs without a grain boundary in the channel. On high current stress, the poly-Si TFT without the grain boundary is less degraded than the poly-Si TFT with the grain boundary because the concentrated electric field near the drain junction is lower.     

一种基于判决反馈的OFDM系统载波频率跟踪算法

研究了多径信道下OFDM系统的一种新的载波频率跟踪算法，这种算法以判决反馈和接收端的时域信号重构为基础。推导了估计结果的精确解，比较了使用原估计结果和新的估计结果进行频偏补偿时系统跟踪性能的不同。通过对算法的仔细分析，发现除了通常的加性噪声外，信道估计误差、子载波数目和子载波的调制方式也影响频偏的估计结果和跟踪范围，而且子载波的数目和调制方式是决定性的因素。这种频率跟踪方法的优点是即使在很低的信噪比下仍然能获得高的跟踪精度，且实现相对简单。     

Understanding and Modeling the Effect of Surfactants in Enhanced Particle Removal from Surfaces in Aqueous Media

The removal of particulate contamination is a critical issue for many manufacturing processes. It is particularly critical to the electronics industry in which small pieces of microscopic debris remaining after chemical mechanical planarization (cmp) using submicron polishing particles can cause device failure. One way to enhance particle removal following the cmp process is to utilize surfactants. Recent research has shown ways to model the effect of surfactants on enhanced particle removal. However, previous research has not demonstrated the effect of ionic strength on enhanced particle removal associated with surfactant use. Past research has also not shown the combined effects of ionic strength and surfactant concentration on enhanced particle removal using surfactants. This article summarizes the parameters affecting particle removal, and it provides data and analysis on the effect of ionic strength as well as the combined effects of ionic strength and surfactant concentration on particle removal following cmp processing.     

ERCM与数据库设计

本文介绍了一种实用的数据库设计方法，它以实体分析法为理论基础，通过对我们日常使用的表进行聚集和归类，完成数据库的逻辑设计，所设计的数据库满足ＢＮＯＦ范式。同时该方法可操作性较强，本文还介绍了自行设计的ＥＲＣＭ数据库辅助设计工具。     

新的载体媒介传递膜

总结了近几年研究和发展的几种载体媒介传递膜。与支撑液膜相比，这些膜具有好的稳定性和长的寿命。对某些物质，如重金属离子、小分子中性碳氢化合物、氨基酸等有高的选择性和通量。它们的传递机理为固定位置跳跃或移动和固定载体2种机理结合。这些研究有望在环境、生物等技术领域中应用。     

HART协议物理层设备的测试（II）

本文介绍HART协议物理层设备的测试要求、测试设备、测试方法及测试时的一些特别说明。     

非接触式半导体少子寿命测试方法——微波反射法

介绍了一种非接触式用于测量少子寿命的微波反射法，并与通常的光电导衰退法进行了比较。     

TiO_2载体表面酸性的研究

利用NH_3吸附和吡啶吸附红外技术研究TiO_2的制备条件对其表面酸性的影响。结果表明,用NH_3水中和TiCl_4溶液方法制备的TiO_2(A)表面有较强的L酸中心,中和条件对表面酸性中心数目和强度有显著影响。由TiOSO_4水解方法制备的TiO_2(B)表面具有较强的L酸中心和较弱的B酸中心,引入不同添加剂可有效地调变TiO_2载体表面的酸性。     

OFDM技术及其应用

首先对OFDM的发展以及应用做了简要的介绍,然后讨论了当前OFDM研究过程中的两个关键技术问题,最后展望了OFDM的未来发展。     

一种新型同位素示踪剂载体及应用

同位素沾污、低注井同位素示踪剂因沉降造成的上返速度慢或无法上返、大孔道地层同位素示踪剂失踪等是影响注水开发油田后期吸水剖面测井资料质量的主要问题。同位素示踪剂载体的物理参数，尤其是其密度，是产生上述问题的重要因素。通过对同位素示踪剂载体技术指标优选而生产的一种新型同位素示踪剂，可以解决低注井同位素上返速度慢的问题，并能有效识别大孔道地层，减少同位素沾污。这种同位素示踪剂载体已在河南油田吸水剖面测井中应用，并见到了很好的效果。