首页 | 本学科首页   官方微博 | 高级检索  
     

基于ODC的软件缺陷度量研究
引用本文:陈爱真,曾福萍,陆民燕. 基于ODC的软件缺陷度量研究[J]. 计算机应用研究, 2010, 27(2): 563-565. DOI: 10.3969/j.issn.1001-3695.2010.02.044
作者姓名:陈爱真  曾福萍  陆民燕
作者单位:北京航空航天大学,工程系统工程系,北京,100191
摘    要:从正交缺陷分类(orthogonal defect classification,ODC)出发,介绍在缺陷度量前需要收集的缺陷数据信息,阐述了缺陷属性的具体分类,然后从单维度和多维度两个角度介绍了如何利用ODC的缺陷属性进行度量分析,并给出了软件组织应用ODC的流程,最后提供了正交缺陷分类方法的应用实例,为缺陷度量的应用研究提供了一种思路。

关 键 词:软件度量; 缺陷度量; 正交缺陷分类

Software defect metric based on orthogonal defect classification
CHEN Ai-zhen,ZENG Fu-ping,LU Min-yan. Software defect metric based on orthogonal defect classification[J]. Application Research of Computers, 2010, 27(2): 563-565. DOI: 10.3969/j.issn.1001-3695.2010.02.044
Authors:CHEN Ai-zhen  ZENG Fu-ping  LU Min-yan
Affiliation:(Dept. of System Engineering of Engineering Technology, Beihang University, Beijing 100191, China )
Abstract:Firstly, according to the orthogonal defect classification, this paper described the defect data information which should be collected before defect measurement execution. Secondly, it described how to use the orthogonal defect classification for measurement analysis from the views of single dimension and multi-dimensional. Thirdly, presented the application process in the software organization. Finally, elaborated the application example. The study of this paper offered a new thought to the application of defect measurement.
Keywords:software metric   defect metric   orthogonal defect classification(ODC)
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《计算机应用研究》浏览原始摘要信息
点击此处可从《计算机应用研究》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号