| 半导体激光器列阵有源区电场随电流变化的定点测量 |
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| 引用本文： | 吴小萍,朱祖华.半导体激光器列阵有源区电场随电流变化的定点测量[J].半导体光电,1993,14(4):371-374,387. |
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| 作者姓名： | 吴小萍 朱祖华 |
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| 作者单位： | 浙江大学信息电子系，浙江大学信息电子系，浙江大学信息电子系 博士生，杭州 310008，杭州 310008，杭州 310008 |
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| 摘 要： | 采用连续波电光检测法，对ＧａＡｓ／ＧａＡｌＡｓ双异质结激光器列阵有源区进行定点测量，实验结果反映了发光区内及发光区外电场随电流变化的不同规律。文中对实验结果给出了合理解释。
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| 关 键 词： | 激光器列阵 电光检测 半导体激光器 |
Research on the Relation between Electric Field and Injected Current at Fixed Points in the Active Layer for Semiconductor Laser Array |
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| Wu Xiaoping,Zhu Zhuhua,Ding Chun Dept. of Information and Electronic,Zhejiang University,Hangzhou.Research on the Relation between Electric Field and Injected Current at Fixed Points in the Active Layer for Semiconductor Laser Array[J].Semiconductor Optoelectronics,1993,14(4):371-374,387. |
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| Authors: | Wu Xiaoping Zhu Zhuhua Ding Chun Dept of Information and Electronic Zhejiang University Hangzhou |
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| Affiliation: | Wu Xiaoping,Zhu Zhuhua,Ding Chun Dept. of Information and Electronic,Zhejiang University,Hangzhou 310008 |
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| Abstract: | Using continuous wave electro-optic probing (CWEOP) method, we probed the variation of electric field with injected current at the fixed points in the active layer. The experimental result shows that there exists difference between the electric field and the injected current within and out of the lasing region. The expla- nation is given. |
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| Keywords: | LD Array Active Layer Continuous Wave Electro--Optic Probing (CWEOP) |
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