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Degradation of light emitting diodes:a proposed methodology |
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| Authors: | Sau Koh Willem Van Driel GQZhang |
| Affiliation: | 1. Delft Institute of Microsystems and Nanoelectronics(Dimes),Delft University of Technology,Mekelweg 6,2628CD Delft,Netherlands;Materials Innovation Institute(M2i),Mekelweg 2,2628 CD,Delft,Netherlands 2. Delft Institute of Microsystems and Nanoelectronics(Dimes),Delft University of Technology,Mekelweg 6,2628CD Delft,Netherlands;Materials Innovation Institute(M2i),Mekelweg 2,2628 CD,Delft,Netherlands;Philips Lighting,LightLabs,NL-5611BD,Eindhoven,Netherlan 3. Delft Institute of Microsystems and Nanoelectronics(Dimes),Delft University of Technology,Mekelweg 6,2628CD Delft,Netherlands |
| Abstract: | Due to their long lifetime and high efficacy,light emitting diodes have the potential to revolutionize the illumination industry.However,self heat and high environmental temperature which will lead to increased junction temperature and degradation due to electrical overstress can shorten the life of the light emitting diode.In this research,a methodology to investigate the degradation of the LED emitter has been proposed.The epoxy lens of the emitter can be modelled using simplified Eyring methods whereas a... |
| Keywords: | LED light degradation lumen overstress current temperature |
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