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白光LED的失效机理分析
引用本文:杨少华,吴福根,张春华. 白光LED的失效机理分析[J]. 半导体光电, 2009, 30(6): 857-859,882
作者姓名:杨少华  吴福根  张春华
作者单位:工业和信息化部第五研究所,电子元器件可靠性物理及其应用技术国家级重点实验室,广州,510610;广东工业大学,实验中心,广州,510006
摘    要:论述了白光发光二极管(LED)在封装和应用中存在的主要模式和失效机理,并介绍了若干失效分析实例,提出了可靠性保证措施,对于进一步完善白光LED封装技术、提高其寿命和可靠性提供参考.
Abstract:
Discussed are the main failure modes and mechanisms of white LEDs during the processes of package and applications. Several cases for analyzing the failures are introduced. Finally, some reliability assurance measures are suggested to improve the lifetime and reliability of white LEDs, which are helpful for further improvement of the packaging technology.

关 键 词:白光LED  失效机理  静电损伤  失效分析

Analysis of Failure Mechanisms of White LEDs
YANG Shao-hua,WU Fu-gen,ZHANG Chun-hua. Analysis of Failure Mechanisms of White LEDs[J]. Semiconductor Optoelectronics, 2009, 30(6): 857-859,882
Authors:YANG Shao-hua  WU Fu-gen  ZHANG Chun-hua
Abstract:Discussed are the main failure modes and mechanisms of white LEDs during the processes of package and applications. Several cases for analyzing the failures are introduced. Finally, some reliability assurance measures are suggested to improve the lifetime and reliability of white LEDs, which are helpful for further improvement of the packaging technology.
Keywords:white LED  failure mechanism  ESD  failure analysis
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