Mechanical fatigue analysis of gold microbeams for RF-MEMS applications by pull-in voltage monitoring |
| |
Authors: | G De Pasquale A Somà and A Ballestra |
| |
Affiliation: | (1) Department of Mechanics, Politecnico di Torino, Corso Duca Degli Abruzzi 24, 10129 Torino, Italy |
| |
Abstract: | This work is focused on the reliability of gold microcantilevers under the effect of mechanical fatigue. A dedicated device
for testing the material is designed and built; the material degradation is monitored during the tests by means of a novel
technique based on the control of the pull-in voltage of the device, which was demonstrated to be related to the loss of mechanical
strength. The fatigue effect is produced through the excitation of the device at a frequency near the resonance; the excitation
frequency and the time of actuation are used as a counter for the number of cycles. The lifetime of the device is measured
under variable levels of vibration amplitudes; the number of cycles to failure is estimated within a specific range of actuation
voltages by means of the W?hler diagram obtained by experiments. The fatigue limit is also estimated following the stair-case method. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |