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Highly Improved Uniformity in the Resistive Switching Parameters of TiO2 Thin Films by Inserting Ru Nanodots
Authors:Jung Ho Yoon  Jeong Hwan Han  Ji Sim Jung  Woojin Jeon  Gun Hwan Kim  Seul Ji Song  Jun Yeong Seok  Kyung Jean Yoon  Min Hwan Lee  Cheol Seong Hwang
Affiliation:1. WCU Hybrid Materials Program, Department of Materials Science and Engineering and Inter‐university Semiconductor Research Center, Seoul National University, Seoul 151‐744, Korea;2. School of Engineering, University of California, Merced, California, 95343, USA
Abstract:
Keywords:resistive switching memory  nanodots  uniformity  thin films
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