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Semiconductor Processing: Novel Hybrid Organic–Inorganic Spin‐on Resist for Electron‐ or Photon‐Based Nanolithography with Outstanding Resistance to Dry Etching (Adv. Mater. 43/2013)
Authors:Erika Zanchetta  Gioia Della Giustina  Gianluca Grenci  Alessandro Pozzato  Massimo Tormen  Giovanna Brusatin
Affiliation:1. Industrial Engineering Department and INSTM, , 35131 Padova, Italy;2. CNR‐IOM, Laboratorio TASC, LILIT Beam Line, , 34149 Trieste, Italy
Abstract:
Keywords:alumina  inorganic resists  dry etching  etching masks  sol‐gel  direct patterning
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