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Recent Progress in Lithium Niobate: Optical Damage,Defect Simulation,and On-Chip Devices |
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| Authors: | Yongfa Kong Fang Bo Weiwei Wang Dahuai Zheng Hongde Liu Guoquan Zhang Romano Rupp Jingjun Xu |
| Affiliation: | 1. School of Physics, Nankai University, Tianjin, 300071 China;2. MOE Key Laboratory of Weak-Light Nonlinear Photonics and TEDA Institute of Applied Physics, Nankai University, Tianjin, 300457 China;3. School of Physics, Nankai University, Tianjin, 300071 China MOE Key Laboratory of Weak-Light Nonlinear Photonics and TEDA Institute of Applied Physics, Nankai University, Tianjin, 300457 China;4. Faculty of Physics, Vienna University, A-1090 Wien, Austria J. Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia |
| Abstract: | |
| Keywords: | defect simulation calculation integrated photonics lithium niobate on-chip devices optical damage resistance |