Unifying measurements in testing measuring instruments |
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| Authors: | S. F. Levin |
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| Affiliation: | (1) Moscow Institute for Expert Evaluation and Testing, Moscow, Russia |
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| Abstract: | Structural and parametric identification are considered for the error probability distribution for a particular type of measuring instrument. Translated from Izmeritel’naya Tekhnika, No. 10, pp. 13–17, October, 2008. |
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| Keywords: | unified measurements error probability distribution structural and parametric identification |
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