Effective conversion efficiency enhancement of solar cell using ZnO/PS antireflection coating layers |
| |
| Authors: | Khaldun A. Salman Khalid Omar Z. Hassan |
| |
| Affiliation: | 1. Department of Physics and Materials Science, Faculty of Science, Chiang Mai University,Chiang Mai, Thailand;2. Thailand Center of Excellence in Physics (ThEP center), CHE, Bangkok, Thailand;3. Energy Policy and Planning Office, Ministry of Energy, Bangkok, Thailand;1. Center of Condensed Matter and Material Physics, School of Physics and Nuclear Energy Engineering, Beihang University, Beijing, 100191, China;2. Institute of Ethnic Preparatory Education, Ningxia University, Yinchuan, 750021, China;1. Department of Chemistry, College of Sciences, Al Imam Mohammad Ibn Saud Islamic University (IMSIU), P.O. Box 5701, Riyadh 11432, Saudi Arabia;2. Department of Chemical Engineering, College of Engineering, King Saud University, P.O. Box 800, Riyadh 11421, Saudi Arabia;3. Department of Physics, College of Sciences, Al Imam Mohammad Ibn Saud Islamic University (IMSIU), P.O. Box 5701, Riyadh 11432, Saudi Arabia;4. Riyadh College of Technology, Technical and Vocational Training Corporation, P.O. Box 42826, Riyadh 11551, Saudi Arabia;5. LPV, Research and Technology Center of Energy, BP 95, 2050 Hammam-Lif, Tunisia |
| |
| Abstract: | Zinc oxide (ZnO) film was deposited on a porous silicon (PS) layer using a radio frequency sputtering system while the PS layer was prepared by a photoelectrochemical etching method. The ZnO/PS layers were found to be an excellent antireflection coating (ARC), exhibiting exceptional light trapping at wavelengths ranging from 400 to 1000 nm because of their lowest effective reflectance. This, in turn, leads to increase the efficiency of solar cell to 18.15%. The ZnO film was highly oriented with the c-axis perpendicular to the PS layer. The average crystallite size of the PS and ZnO/PS layers were 17.06 and 17.94 nm, respectively. Photoluminescence emission peaks proved the nanocrystalline characteristic of the PS layer and the ZnO film. Raman measurements of the ZnO/PS layers were determined at room temperature and indicate that a high-quality ZnO nanocrystalline film was formed. In the current paper, ZnO/PS ARC layers are attractive and offer a promising technique to produce high-efficiency, low-cost solar cells. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
