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A novel Al and Y codoped ZnO/n-Si heterojunction solar cells fabricated by pulsed laser deposition
Authors:Feng-Hao Hsu  Na-Fu Wang  Yu-Zen Tsai  Mau-Phon Houng
Affiliation:1. TNO, Dept. Thin Film Technology, De Rondom 1, 5612 AP Eindhoven, The Netherlands;2. Celsian Glass & Solar B.V., De Rondom 1, 5612 AP Eindhoven, The Netherlands;1. Departamento de Electricidad y Electrónica, ETSI Telecomunicación, Universidad de Valladolid, 47011 Valladolid, Spain;2. Institut de Microelectrònica de Barcelona (IMB-CNM), CSIC, Campus UAB, 08193 Bellaterra, Spain;3. Department of Electronic Engineering, Kumamoto National College of Technology, Kumamoto 861-1102, Japan
Abstract:Al and Y codoped ZnO (AZOY) transparent conducting oxide (TCO) thin films were first deposited on n-Si substrates by pulsed laser deposition (PLD) to form AZOY/n-Si heterojunction solar cells. However, the properties of the AZOY emitter layers are critical to the performance of AZOY/n-Si heterojunction solar cells. To estimate the properties of AZOY thin films, films deposited on glass substrates with various substrate temperatures (Ts) were analyzed. Based on the experimental results, optimal electrical properties (resistivity of 2.8 ± 0.14 × 10?4 Ω cm, carrier mobility of 27.5 ± 0.55 cm2/Vs, and carrier concentration of 8.0 ± 0.24 × 1020 cm?3) of the AZOY thin films can be achieved at a Ts of 400 °C, and a high optical transmittance of AZOY is estimated to be >80% (with glass substrate) in the visible region under the same Ts. For the AZOY/n-Si heterojunction solar cells, the AZOY thin films acted not only as an emitter layer material, but also as an anti-reflected coating thin film. Thus, a notably high short-circuit current density (Jsc) of 31.51 ± 0.186 mA/cm2 was achieved for the AZOY/n-Si heterojunction solar cells. Under an AM1.5 illumination condition, the conversion efficiency of the cells is estimated at only approximately 4% (a very low open-circuit voltage (Voc) of 0.24 ± 0.001 V and a fill factor (FF) of 0.51 ± 0.011) without any optimization of the device structure.
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