Microwave transmission method for measuring minority-carrier lifetime in silicon slices |
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| Authors: | Thomas R.E. Makios V. Ogletree S. Mckillican R. |
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| Affiliation: | Carleton University, Faculty of Engineering, Ottawa, Canada; |
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| Abstract: | A microstrip transmission method is described for measuring minority-carrier lifetime in thin silicon slices. This method is used to correct results published earlier by Makios and Thomas, using the HP 8410 network analyser as a microwave interferometer. Measured results for high-resistivity samples are shown to extend the earlier curves of Ross and Madigan. |
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