Design for testability and DC test of switched-capacitor circuits |
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Authors: | Ihs H Dufaza C |
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Affiliation: | Lab. d'Inf., Univ. des Sci. et Tech. du Languedoc, Montpellier; |
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Abstract: | The authors present a design for testability (DFT) technique for switched-capacitor circuits. The principle is to reconfigure the SC circuit so that it realises a cascade of DC voltage amplifiers in which all capacitors are represented in a simple form. Then, the transfer function becomes a product of the ratio of two capacitors and the sensibility of the DC gain to each capacitor is close to unity. Consequently, a simple test with partial diagnosis is realised with some DC voltage stimuli and gives an accurate test result at the output of the last voltage amplifier |
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