Nanoscale control of exchange bias with BiFeO3 thin films |
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Authors: | Martin Lane W Chu Ying-Hao Holcomb Mikel B Huijben Mark Yu Pu Han Shu-Jen Lee Donkoun Wang Shan X Ramesh R |
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Affiliation: | Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA. lwmartin@lbl.gov |
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Abstract: | We demonstrate a direct correlation between the domain structure of multiferroic BiFeO3 thin films and exchange bias of Co 0.9Fe 0.1/BiFeO3 heterostructures. Two distinct types of interactions - an enhancement of the coercive field ( exchange enhancement) and an enhancement of the coercive field combined with large shifts of the hysteresis loop ( exchange bias) - have been observed in these heterostructures, which depend directly on the type and crystallography of the nanoscale ( approximately 2 nm) domain walls in the BiFeO3 film. We show that the magnitude of the exchange bias interaction scales with the length of 109 degrees ferroelectric domain walls in the BiFeO 3 thin films which have been probed via piezoresponse force microscopy and X-ray magnetic circular dichroism. |
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