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屏蔽微带线特性的谱域导抗法分析
引用本文:李超, 周斌, 李芳, 阴和俊. 屏蔽微带线特性的谱域导抗法分析[J]. 电子与信息学报, 2004, 26(4): 632-639.
作者姓名:李超  周斌  李芳  阴和俊
作者单位:中国科学院电子学研究所,北京,100080;中国科学院电子学研究所,北京,100080;中国科学院电子学研究所,北京,100080;中国科学院电子学研究所,北京,100080
摘    要:本文用谱域导抗法分析了微带线的特性,研究了屏蔽盒对微带线传播特性和色散特性的影响。谱域导抗概念的引入大大简化谱域方法中冗长的场公式推导过程,其分析结果又能保证相当高的精度。本文的研究结果表明:屏蔽盒的顶盖使微带线等效介电常数变小,对色散特性影响不大;屏蔽盒的侧壁使微带线等效介电常数变大,并减小了微带线的色散。

关 键 词:屏蔽微带线   谱域导抗法
文章编号:1009-5896(2004)04-0632-08
收稿时间:2002-09-03
修稿时间:2002-09-03

Analysis of Shielded Microstrip by Spectral Domain Immittance Approach
Li Chao, Zhou Bin, Li Fang, Yin He-jun. Analysis of Shielded Microstrip by Spectral Domain Immittance Approach[J]. Journal of Electronics & Information Technology, 2004, 26(4): 632-639.
Authors:Li Chao  Zhou Bin  Li Fang  Yin He-jun
Affiliation:Institute of Electronics Chinese Academy of Science Beijing 100080 China
Abstract:Influence of the shielding box on the propagation and dispersion characteristics of microstrip has been analyzed by the spectral domain immittance approach. This greatly simplified the formulation process in traditional spectral domain method and the results remain a high level of accuracy. Numerical results show that top metal cover decreases the effective dielectric constant of microstrip, however, it does not have noticeable effects' on the dispersion characteristics of microstrip. The results also show that metal sidewalls increase the effective dielectric constant of microstrip and lower the dispersion of microstrip.
Keywords:Shielded microstrip   Spectral domain immittance approach
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