| 电子产品研制阶段可靠性增长试验研究 |
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| 引用本文： | 阳红成,苏小光.电子产品研制阶段可靠性增长试验研究[J].国外电子元器件,2006(12):32-35. |
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| 作者姓名： | 阳红成 苏小光 |
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| 作者单位： | 南京航空航天大学,航空宇航学院,江苏,南京,210016 |
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| 摘 要： | 结合工程实际经验,深入讨论了可靠性增长过程及实现途径,在保持试验条件和改进过程不变的条件下,实施了对具体型号电子产品的可靠性增长试验,达到了预期的可靠性增长目标,并且利用可靠性增长试验的数学模型(AMSAA模型)来评估产品的可靠性增长,对开展可靠性增长与可靠性增长试验工作具有重要的实际意义.
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| 关 键 词： | 电子产品 可靠性增长 可靠性增长试验 AMSAA模型 |
| 文章编号： | 1006-6977（2006）12-0032-03 |
| 收稿时间： | 2006-07-06 |
| 修稿时间： | 2006年7月6日 |
Research of reliability growth and reliability growth test of electronic products in development stage |
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| YANG Hong-cheng,SU Xiao-guang.Research of reliability growth and reliability growth test of electronic products in development stage[J].International Electronic Elements,2006(12):32-35. |
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| Authors: | YANG Hong-cheng SU Xiao-guang |
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| Affiliation: | College of Aeronautics Space Navigation ,Nanjing University of Aeronautics and Astronautics,Nanjing 210016, China |
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| Abstract: | Reliability growth progress and technique,the means of reliability growth test are discussed. Reliability growth test to idiographic model electronic products are done on condition that the previous test condition and the modification procedure are kept unchanged. It achieved prospective target. Reliability growth of electronic products is evaluated based on AMSAA model.All of them are very important to the work of reliability growth. |
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| Keywords: | electronic products reliability growth reliability growth test AMSAA model |
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