侵彻过载高速存储测试的研究与实现

针对混合型单片机应用中数据捕获率不足问题,在分析其机理及原因基础上,采用外置高速模数转换器（A/D）与单片机的串行通用接口（SPI）构成串行采集存储结构.利用单片机所提供的时钟源将数据捕获率由200 ksps 提高到780 ksps,在此基础上提出了三轴过载测量总体方案.研究结果表明,通过提高SPI 总线时钟速率,可将数据捕获率进一步提高到2.5 Msps,这将作为今后的研究方向.

High-speed storage measurement of the projectile body penetration overload

For the disadvantages of the hybrid microcontroller application data capture, the serial acquisition storage structure is created by adopting external Analog to Digital(A/D) converter and the single chip microcomputer Serial Peripheral Interface(SPI) bus based on analyzing its mechanism and reason. The data capture rate is increased from 200 ksps to 780 ksps by using the clock source provided by single chip microcomputer. An overall scheme of the triaxial overload measurement is proposed based on this work. The results show that the capture rate can be increased to 2.5 Msps by improving the SPI bus clock rate, and it will serve as the future research direction.