首页 | 本学科首页   官方微博 | 高级检索  
     

某高压电连接器的失效分析
引用本文:何志刚,周庆波,龚国虎,梁栋程,王晓敏.某高压电连接器的失效分析[J].太赫兹科学与电子信息学报,2014,12(6):942-945.
作者姓名:何志刚  周庆波  龚国虎  梁栋程  王晓敏
作者单位:Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China;Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China;Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China;Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China;Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China
摘    要:针对某型号高压电连接器在电压冲击试验中的失效现象,进行失效分析.分析手段包括X 射线检查、内部检查和金相分析等.检测发现该元件存在多芯导线压接损伤、剥线损伤等缺陷.根据该高压电连接器的失效模式和各项检测结果,分析得出了其失效机理.最后,在元件设计、工艺控制、质量监控方面提出了改进建议.建议实施后该元件通过了各项检测,质量可靠性得到了提升.

关 键 词:高压电连接器  失效分析  失效机理  X射线检查
收稿时间:2014/1/23 0:00:00
修稿时间:2014/2/28 0:00:00

Failure analysis of a high voltage electric connector
HE Zhi-gang,ZHOU Qing-bo,GONG Guo-hu,LIANG Dong-cheng and WANG Xiao-min.Failure analysis of a high voltage electric connector[J].Journal of Terahertz Science and Electronic Information Technology,2014,12(6):942-945.
Authors:HE Zhi-gang  ZHOU Qing-bo  GONG Guo-hu  LIANG Dong-cheng and WANG Xiao-min
Affiliation:(Metrology and Testing Center,China Academy of Engineering Physics,Mianyang Sichuan 621999,China)
Abstract:The failure phenomenon happened in a certain model of High-Voltage Electric Connectors(HVEC) after voltage impulse testing is studied by applying testing methods of x-ray inspecting, internalchecking, metallographic analysis,etc. The testing results reveal that several defects including multicorewire crimping damage and wire stripping injury are found in these devices. According to their failure modeand testing outcomes,the failure mechanism is analyzed and many reasonable improving approaches fromthe aspects of devices design,processing control and quality monitoring are suggested. After implementingthese recommendations, the newly manufactured high-voltage electric connectors can pass all theexamining items and their reliabilities are greatly enhanced.
Keywords:High Voltage Electric Connector  failure analysis  failure mechanism  X-ray inspection
本文献已被 维普 等数据库收录!
点击此处可从《太赫兹科学与电子信息学报》浏览原始摘要信息
点击此处可从《太赫兹科学与电子信息学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号