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利用能量过滤TEM获取外延量子点的成分信息
引用本文:廖晓舟,邹进,蒋最敏.利用能量过滤TEM获取外延量子点的成分信息[J].电子显微学报,2006,25(3):208-213.
作者姓名:廖晓舟  邹进  蒋最敏
作者单位:Electron Microscopy Core Facility(电子显微镜中心实验室),the University of Chicago,Chicago,IL 60637,USA;School of Engineering and Centre for Microscopy and Microanalysis(工学院及电子显微和微分析中心),The University of Queensland,St Lucia,QLD 4072,Australia;Applied Surface Physics Laboratory(National Key Laboratory)(应用表面物理国家实验室),Fudan University,Shanghi 200433,China
摘    要:半导体量子点应用于许多关键的现代科学技术中。量子点的尺寸和成分对决定量子点光电性质十分重要。由于量子点的尺寸很小,表征量子点的成分及其分布是一项很有挑战性的任务。本文综述了能量过滤透射电子显微术如何应用于量子点成分的研究。

关 键 词:半导体量子点  光电性质  透射电子显微术  电子能量损失谱
文章编号:1000-6281(2006)03-0208-06
收稿时间:2006-02-15
修稿时间:2006-02-15

Extracting compositional information of epitaxial quantum dots using energy-filtered transmission electron microscopy
LIAO Xiao-zhou,ZOU Jin,JIANG Zui-min.Extracting compositional information of epitaxial quantum dots using energy-filtered transmission electron microscopy[J].Journal of Chinese Electron Microscopy Society,2006,25(3):208-213.
Authors:LIAO Xiao-zhou  ZOU Jin  JIANG Zui-min
Affiliation:1 The James Franck Institute, The University of Chicago, Chicago, IL 60637, USA ; 2 School of Engineering and Centre for Microscopy and Microanalysis, The University of Queensland, St Lucia, QLD 4072, Australia; 3 Applied Surface Physics laboratory (National Key laboratory
Abstract:Semiconductor quantum dots have potential applications in many key areas of modem technology. The dimension and composition of quantum dots are very important in determining the opto-electronic properties of the quantum dots. However, the characterization of quantum dot composition profiles is a very challenging task because of small quantum dot sizes. In this papers, we review how energy-filtered transmission electron microscopy is applied to the investigation of quantum dot composition.
Keywords:semiconductor quantum dot  opto-electronic property  transmission electron microscopy  electron energy loss spectrum
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