| 硫化锌薄膜的微结构剖析 |
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| 引用本文： | 柳兆洪 陈谋智. 硫化锌薄膜的微结构剖析[J]. 固体电子学研究与进展, 1999, 19(1): 97-100 |
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| 作者姓名： | 柳兆洪 陈谋智 |
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| 作者单位： | 厦门大学物理系 |
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| 摘 要： | 用Ｘ射线衍射和Ｘ射线光电子能谱技术，对分舟热蒸发法研制的掺铒（Ｅｒ）硫化锌直流电致发光薄膜及硫化锌粉料进行剖析，获得薄膜表面及粉料的构态信息，讨论了影响微晶薄膜质量的主要因素。
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| 关 键 词： | 硫化锌 直流电致发光 微晶薄膜 稀土掺杂 |
Microstructural Dissection of Zinc Sulfide Thin Films |
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| Liu Zhaohong Chen Mouzhi Sun Shunong Liu Ruitang Lin Aiqing Deng Cailing Xiao Xifeng. Microstructural Dissection of Zinc Sulfide Thin Films[J]. Research & Progress of Solid State Electronics, 1999, 19(1): 97-100 |
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| Authors: | Liu Zhaohong Chen Mouzhi Sun Shunong Liu Ruitang Lin Aiqing Deng Cailing Xiao Xifeng |
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| Abstract: | The zinc sulfide DCEL thin films doped with erbium, prepared by thermal evaporation with two boats, are analysed with XRD and XPS technologies. The structure state information of ZnS powder and thin film surface is obtained. The factors influencing on the quality of microcrystalline thin films are discussed as well. |
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| Keywords: | Zinc Sulfide(ZnS) Direct Current Electroluminescence(DCEL) Microcrystalline Thin Film Rare Earth Element Doped |
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