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一种基于JTAG的CLB内建自测试方法
引用本文:郭德春,杨金孝,陈雷,周涛,张帆. 一种基于JTAG的CLB内建自测试方法[J]. 微电子学与计算机, 2011, 28(5)
作者姓名:郭德春  杨金孝  陈雷  周涛  张帆
作者单位:1. 西北工业大学,陕西,西安,710129
2. 北京微电子技术研究所,北京,100076
摘    要:针对Virtex-4型FPGA中可编程逻辑块故障检测的需求,提出了一种基于JTAG的内建自测试方法,并基于DEV++平台自行开发了基于并口的专用边界扫描测试软件.该方法可以比较可靠的检测FPGA中存在故障的可编程逻辑块,并能比较高的分辨率实现故障的定位.与传统的单故障检测方法相比,提出的改进型测试方法可以检测和定位多个故障CLB,并可以对故障类型进行诊断.实验结果表明:提出的测试方法可以精确的检测和定位存在故障的多个CLB,对具有类似结构的SRAM型FPGA具有普遍适用性.

关 键 词:内建自测试  可编程逻辑块  故障检测

Build-In Self Test of CLBs Based on JTAG
GUO De-chun,YANG Jin-xiao,CHEN Lei,ZHOU Tao,ZHANG Fan. Build-In Self Test of CLBs Based on JTAG[J]. Microelectronics & Computer, 2011, 28(5)
Authors:GUO De-chun  YANG Jin-xiao  CHEN Lei  ZHOU Tao  ZHANG Fan
Abstract:This paper proposes a Built-In Self-Test approach able to detect and accurately diagnose all single and practically all multiple faulty configurable logic blocks(CLBs) in Virtex-4 FPGA with better diagnostic resolution.Unlike conventional BIST,the method proposed could detect and locate multiple fault CLBs concurrently.Based on the location of the fault CLBs,we could also identify their internal faulty modules or modes of operation.For the completion of fault testing,a testing program is developed.The testi...
Keywords:JTAG  FPGA
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