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Synergistic microwave and structural studies of C-type Ho2Si2O7
Authors:Kishwar Khan  Asghari Maqsood
Affiliation:Thermal Transport Laboratory, School of Chemical and Materials Engineering (SCME), National University of Sciences and Technology (NUST), H-12, Islamabad, Pakistan
Abstract:Ho2Si2O7 material exists in four polymorphs, a triclinic low temperature phase (type-B), a monoclinic modification (type-C), high temperature monoclinic (type-D), and high temperature orthorhombic modification (type-E). The structural properties are measured by XRD and the morphology is noted through scanning electron microscopy (SEM). The dc electrical resistivity (ρ) as a function of temperature and dielectric properties of C-type Ho2Si2O7 in the microwave region is measured. The activation energy is calculated from ln ρ versus 1/kBT plot. The activation energy is 0.119 ± 0.001 eV. Both the real (?′) and imaginary parts of permittivity (?″) decrease slightly as the frequency increases up to 1.5 GHz, after that ?′ increases while ?″ decreases as the frequency increases. At around 2.45 GHz, resonance is observed.
Keywords:Electrical transport  Dielectric response  X-ray diffraction  Inorganic materials
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