Board-level built-in self-repair method of RAM |
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Authors: | Yanjie Dou Huiqin Zhan Yakun Chen Hongliang Shang |
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Affiliation: | 1. Department of Automation Engineering, Univevsity of Electronic Science and Technology of China, Chengdu, 611731, China 2. No. 2006 Xiyuan Ave., Western High-tech District, Chengdu, 611731, China
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Abstract: | This paper describes the method of built-in self-repairing of RAM on board, designs hardware circuit, and logic for the RAM’s faults self-repairing system based on FPGA. The key technology is that it utilizes FPGA to test RAM according to some algorithm to find out failure memory units and replace the faulty units with FPGA. Then it can build a memory that has no fault concern to external controller, and realizes the logic binding between external controller and RAM. Micro Controller Unit (MCU) can operate external RAM correctly even if RAM has some fault address units. Conventional MCS-51 is used to simulate the operation of MCU operating external memory. Simulation shows FPGA can complete the faulty address units’ mapping and MCU can normally read and write external RAM. This design realizes the RAM’s built-in self-repairing on board. |
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Keywords: | Key words RAM testing Built-in self-repairing Faulty address mapping Function test |
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