首页 | 本学科首页   官方微博 | 高级检索  
     

基于JTAG技术的嵌入式交叉调试软件
引用本文:阳富民,柯滔,涂刚.基于JTAG技术的嵌入式交叉调试软件[J].计算机工程与设计,2005,26(10):2817-2819.
作者姓名:阳富民  柯滔  涂刚
作者单位:华中科技大学,计算机学院,湖北,武汉,430074
摘    要:介绍了JTAG交叉调试技术及Xscale芯片的增强调试功能,并在此基础上给出一种嵌入式交叉调试软件系统的设计及实现。主机端环境为LINUX操作系统,并利用GDB调试软件,目标系统采用Xscale芯片。该系统的特点是纯软件实现,廉价方便。

关 键 词:JTAG  嵌入式系统  交叉调试
文章编号:1000-7024(2005)10-2817-03
收稿时间:2004-09-01
修稿时间:2004-09-01

Embedded cross debugging software based on JTAG
YANG Fu-min,KE Tao,TU Gang.Embedded cross debugging software based on JTAG[J].Computer Engineering and Design,2005,26(10):2817-2819.
Authors:YANG Fu-min  KE Tao  TU Gang
Affiliation:School of Computer Science, Huazhong University of Science and Technology, Wuhan 430074, China
Abstract:The cross debugging technology was introduced with JTAG and the debugging functions of Xscale was emhanced. Thedesign and implementation technology of an embedded cross debugging software system was provided in details.The host ran with linux operating system, and GDB was adopted as host debugger. The target chip is Xscale. The peculiarity of this system is its cheapness due to pure software implementation.
Keywords:JTAG  embedded system  cross debugging
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号