| 一种离散余弦变换电路的并发故障检测结构… |
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| 引用本文： | 陈禾,毛志刚,叶以正. 一种离散余弦变换电路的并发故障检测结构…[J]. 微处理机, 1999, 0(1): 45-48 |
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| 作者姓名： | 陈禾 毛志刚 叶以正 |
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| 作者单位： | 哈尔滨工业大学微电子中心!哈尔滨150001 |
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| 摘 要： | 本文提出了一种离散余弦变换 (DCT)电路的并发故障检测结构。DCT采用 B.G.L ee算法蝶型结构实现 ,检测采用的方法是基于算法的并发故障检测容错方法。与其它并发故障检测容错结构相比 ,本文提出的并发故障检测 DCT结构在硬件及时间冗余度上均优越
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| 关 键 词： | 离散余弦变换(DCT) 蝶型结构 并发故障检测(CED) 基于算法的容错(ABFT)技术 |
One Concurrent Error Detection Scheme for DCT |
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| Chen He Microelectronics Center,Harbin Institute of Technology,Harbin. One Concurrent Error Detection Scheme for DCT[J]. Microprocessors, 1999, 0(1): 45-48 |
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| Authors: | Chen He Microelectronics Center Harbin Institute of Technology Harbin |
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| Affiliation: | Chen He Microelectronics Center,Harbin Institute of Technology,Harbin 150001 |
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| Abstract: | In this paper,one concurrent error detection(CED) design is proposed for discrete cosine transform (DCT).DCT is realized by butterfly architecture of B.G.Lee fast algorithm,and algorithm-based fault tolerance is used for CED.We show that this scheme needs lower hardware and time overhead than other design. |
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| Keywords: | discrete cosine transform(DCT) butterfly architecture concurrent error detection(CED) algorithm-based fault tolerance(ABFT) |
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