Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers

The response of IC operational amplifiers (op amps) to pulsed ionizing irradiation is studied theoretically and experimentally. The major mechanisms of the radiation response are covered. The contributions of main op-amp stages to the output-voltage response are analyzed. The ionization-induced failure of an op amp is traced to its intermediate stages. It is established that the recovery time depends on the type of compensation employed. A block-model approach is proposed as a method for the prediction of transient radiation responses. Ways to define the performance index of an op amp exposed to pulsed ionizing radiation are discussed.