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反射面天线单孔战损补片修复方法研究
引用本文:付世奇,潘谊春,陈辉,孙鹏. 反射面天线单孔战损补片修复方法研究[J]. 空军雷达学院学报, 2012, 0(5): 327-330
作者姓名:付世奇  潘谊春  陈辉  孙鹏
作者单位:1. 空军预警学院研究生管理大队,武汉430019
2. 空军预警学院五系,武汉430019
3. 部队,南宁 530000
4. 部队,湖北襄阳 441021
5. 部队,北京100021
摘    要:针对雷达对抗装备反射面天线战损模式,基于高频电磁场分析方法,运用现有战场抢修手段,通过FEKO软件模拟修复,探讨了反射面天线单孔损伤补片修复方法.仿真结果表明:对反射面破孔,不考虑补片物理尺寸的情况下,采用方法三修复效果最佳;在考虑补片物理尺寸的影响下,采用方法一修复效果最好;当反射面破孔半径大于3λ时,采用换件修复.这对战时反射面修复提供了一定的理论依据,具有一定的参考价值.

关 键 词:反射面补片  仿真分析  天线方向图  反射面战损

Method for Single-Aperture Patch Repairing of Reflector Antenna Damaged in Battle
FU Shi-qi,PAN Yi-chun,CHEN Hui,SUN Peng. Method for Single-Aperture Patch Repairing of Reflector Antenna Damaged in Battle[J]. Journal of Air Force Radar Academy, 2012, 0(5): 327-330
Authors:FU Shi-qi  PAN Yi-chun  CHEN Hui  SUN Peng
Affiliation:1.Department of Graduate Management,Air Force Early Warning Academy,Wuhan 430019,China;2.No.5 Department,Air Force Early Warning Academy,Wuhan 430019,China;3.95246 Unit of PLA,Nanning 530000,China;4.95980 Unit of the PLA,Xiangyang 441021,China;5.95865 Unit of the PLA,Beijing 100021,China)
Abstract:In view of the fighting damage mode of reflector antenna in the radar countermeasure equipment,this paper discusses the method for damaged single-aperture patch repairing of reflector antenna in terms of analysis methods of HF electromagnetic field,using the current urgent repairing means for battle field and FEKO software to simulate repairing.Simulation results show that it is of the best effect to use the third scheme proposed in this paper for repairing the broken aperture of the reflector when not taking the physical size of the patch into consideration;it is of the best effect to use the first scheme for repairing when taking the physical size of the patch into consideration;and using the replaceable part repairing scheme while the broken aperture radius is above than 3λ,which provides a certain theoretical basis and reference for reflector repairing during wartime.
Keywords:reflector patch  simulation analysis  antenna pattern  damage of reflector in battle field
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