| Abstract: | Access of distributed generation gets complicated at the distribution level, and hence managing these systems effectively becomes highly challenging. Microgrids have been proposed as a way of integrating a large number of distributed renewable energy sources with a distribution system. They are low to medium voltage networks of small load clusters with distributed generation sources and storages. Microgrids can be operated in the islanded mode or the grid‐connected mode. If a microgrid is connected to the system, it is seen as a single aggregate load. One of the potential advantages of a microgrid is that it could provide more reliable supply to customers by islanding itself from the system in the event of a major disturbance. However, a major problem with microgrid implementation in islanded operation is designing a proper protection scheme. The fault currents for grid‐connected and islanded microgrids are significantly different. Additionally, high penetration of inverter‐connected distributed generation sources leads to conditions where no standard overcurrent protection method will work. Overcurrent protection is considered as the backbone of any protection strategy, especially in distribution systems. Distribution systems constitute the largest portion of the power system network, and therefore the diagnosis of faults in this system is a challenging task. Faults occurring in distribution systems will affect the reliability, security, and quality of a power system. Field‐processable gate array (FPGA) Xilinx Zynq‐based numerical overcurrent relay protection is provided to the microgrid that is operated in islanded mode. This results in faster discrimination and quicker isolation of the faulty section from the microgrid. This improves the reliability of the microgrid because the fault is rapidly diagnosed and isolated from the healthy part, thanks to the high‐speed operation of the 800‐MHz FPGA Xilinx Zynq‐based numerical overcurrent relay. This system is simulated using MATLAB Simulink SimPower system tool box and LabView software. © 2014 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. |
