| 内调制光敏管的可靠性分析和设计 |
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| 引用本文： | 黄启俊,何民才,戴锋,蔡本兰. 内调制光敏管的可靠性分析和设计[J]. 半导体技术, 1999, 24(3): 50-54 |
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| 作者姓名： | 黄启俊 何民才 戴锋 蔡本兰 |
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| 作者单位： | 武汉大学物理系,武汉,430072 |
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| 基金项目： | 国家自然科学基金，国家科技攻关项目 |
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| 摘 要： | 介绍了内调制光敏管的可靠性试验及其失效模式和失效机理的分析。寿命试验结果表明内调制光敏管的平均寿命超过１９４９６小时。
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| 关 键 词： | 内调制光敏管 可靠性 寿命试验 失效分析 |
Reliability Analysis and Design for Intramodulated Photodetector |
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| Huang Qijun,He Mincai,Dai Feng,Cai Benlan. Reliability Analysis and Design for Intramodulated Photodetector[J]. Semiconductor Technology, 1999, 24(3): 50-54 |
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| Authors: | Huang Qijun He Mincai Dai Feng Cai Benlan |
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| Abstract: | In this paper,the reliability test,and its failure mode and failure mechanism analysis for intramodulated photodetector have been discussed in detail.The result of life test has shown that the MTBF of the device is longer than 19496 hours. |
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| Keywords: | Intramodulated photodetector Reliability Life test Failure analysis |
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