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Near-field EMC study to improve electronic component reliability |
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| Authors: | G Duchamp D Castagnet A Meresse |
| Affiliation: | aUniversity Bordeaux, 351 cours de la Libération, 33405 Talence Cedex, France |
| Abstract: | |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |
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