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A 1.8-V 700-mb/s/pin 512-mb DDR-II SDRAM with on-die termination and off-chip driver calibration
Authors:Changsik Yoo Kye-Hyun Kyung Kyunam Lim Hi-Choon Lee Joon-Wan Chai Nak-Won Heo Dong-Jin Lee Chang-Hyun Kim
Affiliation:Div. of Electr. & Comput. Eng., Hanyang Univ., Seoul, South Korea;
Abstract:A 512-Mb DDR-II SDRAM has achieved 700-Mb/s/pin operation at 1.8-V supply voltage with 0.12-/spl mu/m DRAM process. The low supply voltage presents challenges in high data rate and signal integrity. Circuit techniques such as hierarchical I/O lines, local sense amplifier, and fully shielded data lines without area penalty have provided improved data access time and, thus, high data rate can be achieved. Off-chip driver with calibrated strength and on-die termination are utilized to give sufficient signal integrity for over 533-Mb/s/pin operation.
Keywords:
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