TMS320F28XX系列DSP测试方法研究与实现

本项目是基于美国TI公司TMS320F28xx系列DSP，进行的测试方法研究与实现。测试方法用于北京自动测试技术研究所自主研发的国产自测试设备（ATE）BC3192V50大规模集成电路测试系统。测试的原理是，通过TMS320F28xx系列DSP配备的SCI（Serial Communication Interface)串行通信接口，以此作为桥梁完成ATE与芯片之间的通信。同时，实现自动测试设备与测试系统的测试向量的匹配。而后，完成TMS320F28xx系列DSP的功能测试以及直流参数测试。

Research and implementation of TMS320F28XX series DSP test method

This project is based on the American company's TI TMS320F28xx series DSP,carries on the test method research and the realization.Test method for domestic ATE of Beijing Automatic Test Technology Research Institute developedBC3192V50——Large scale integrated circuit test system.The principle of testing is,throughSCI(Serial Communication Interface)of TMS320F28xxDSP,As a bridge to complete the communication between the ATE and the chip.Meanwhile,match test vectors of automatic test equipment and test system.Then Complete the function test of TMS320F28xx series DSP and the test of DC parameters and dynamic parameters.