The transition from the d- to s-state due to thermal fluctuationfor high-Tc superconductors as an evidence from the microwavepenetration-depth measurement |
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Authors: | Li Jui Chen Juh Tzeng Lue |
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Affiliation: | Dept. of Phys., Nat. Tsing Hua Univ., Hsinchu; |
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Abstract: | A temperature dependence of the penetration depth λ(T) measurement for the high-Tc superconductors YBa2Cu 3O7-δ and Tl2Ba2CaCu 2O7 thin films elucidates a T2 dependence at low temperatures and an exponential dependence at high temperatures. The transition temperature for the shift from T2 to exponential dependence decreases as the duration for the samples exposed to air increases. An impurity scattered mechanism to fluctuate a pure d-wave to the s-wave by thermal fluctuation is proposed for the pairing states of these high-Tc superconducting films |
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