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Electric force microscopy of dielectric heterogeneous polymer blends |
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| Authors: | A.V. Krayev |
| Affiliation: | a Quantum Polymer Technologies Corp., 3573 Westwind Blvd, Santa Rosa, CA, USA b Department of Chemical Engineering and Materials Science, University of California Davis, One Shields Avenue, Davis, CA 995616, USA |
| Abstract: | We report the applicability of Electric Force Microscopy (EFM) for the analysis of thin films of dielectric heterogeneous polymer blends constituted of polymers with both close and significantly different dielectric constants and offer a simple model that enables quantitative analysis of EFM images of such blends. |
| Keywords: | Polymer blends Electric force microscopy EFM |
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