Thickness and composition dependence of the glass transition temperature in thin random copolymer films |
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Authors: | Chul Ho Park Moonhor Ree Jin Chul Jung |
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Affiliation: | a Department of Materials Science and Engineering and Polymer Research Institute, Pohang University of Science and Technology, Pohang 790-784, South Korea b Manufacturing Technology Team, Semiconductor Division, Samsung Electronics, 445-701, South Korea c Department of Chemistry and Center for Integrated Molecular Systems and Polymer Research Institute, Pohang University of Science and Technology, Pohang 790-784, South Korea |
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Abstract: | Glass transition temperatures (Tg) of thin poly(styrene-co-methyl methacrylate) and poly(2-vinyl pyridine-co-styrene) films coated on a native oxide surface of Si wafer (100) were measured by ellipsometry. The thickness dependence of Tg can be properly fitted by previously suggested equation developed for homopolymers, based upon a continuous multi-layer model, although one component in thin random copolymer films demonstrates a slightly favorable interaction between a substrate and thin film, and another demonstrates a strongly favorable interaction. Surface and interface have a strong influence on Tg of thin film coated on substrate: the surface has the effect of reducing Tg, whereas the interface increases the Tg according to the degree of interaction between a substrate and thin film. This degree of interaction can be quantified as an interaction parameter (k), and is dependent on the composition of random copolymers. For the estimation of k values of thin random copolymer films, we proposed a parallel type additive function (1/kran=w1/k1+w2/k2) where w is a weight fraction of component. |
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Keywords: | Glass transition Thin film Random copolymer |
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