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| 利用白光干涉垂直扫描法测量波片延迟量 | |
| 引用本文： | 王军,陈磊,吴泉英,臧涛成.利用白光干涉垂直扫描法测量波片延迟量[J].激光与光电子学进展,2013,50(1):11203-150. |
| 作者姓名： | 王军 陈磊 吴泉英 臧涛成 |
| 作者单位： | 王军:苏州科技学院数理学院， 江苏 苏州 215009 陈磊:南京理工大学电光学院， 江苏 南京 210094 吴泉英:苏州科技学院数理学院， 江苏 苏州 215009 臧涛成:苏州科技学院数理学院， 江苏 苏州 215009 |
| 基金项目： | 浙江省眼视光学和视觉科学重点实验室省部共建国家重点实验室培育基地开放课题、江苏省“六大人才高峰”项目和苏州科技学院科研基金资助课题。 |
| 摘 要： | 将白光偏振干涉、迈克耳孙干涉仪和垂直扫描系统相结合,提出了一种利用白光干涉垂直扫描测量波片延迟量(包括级次信息)的方法。准直的白光经偏振干涉系统形成两束偏振方向相同的线偏光,它们进入迈克耳孙干涉仪后分别被两干涉臂的平面镜反射形成四束光,在压电传感器(PZT)驱动干涉仪动镜垂直扫描的过程中,它们两两干涉,形成3组白光干涉包络。根据CCD各像素记录的白光干涉信号,计算白光干涉包络之间的光程差,即可获取被测延迟量。实验测量了一多级波片的延迟量,其结果(4268.1nm)与使用光谱扫描法测量得到的结果(4269.9nm)相吻合。 |
| 关 键 词： | 光学测量 波片 延迟量 迈克耳孙干涉仪 偏振干涉 白光干涉垂直扫描 |
| 收稿时间： | 2012/8/23 |
Retardation Measurement of Wave Plates Using White-Light Interference Vertical Scanning Method |
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| Wang Jun,Chen Lei,Wu Quanying,Zang Taocheng.Retardation Measurement of Wave Plates Using White-Light Interference Vertical Scanning Method[J].Laser & Optoelectronics Progress,2013,50(1):11203-150. | |
| Authors: | Wang Jun Chen Lei Wu Quanying Zang Taocheng |
| Affiliation: | 1(1School of Mathematics and Physics,Suzhou University of Science and Technology, Suzhou,Jiangsu 215009,China 2School of Electronic Engineering and Photoelectric Technology,Nanjing University of Science and Technology,Nanjing,Jiangsu 210094,China) |
| Abstract: | A method using Michelson interferometer, polarization interferometry system and white-light vertical scanning system for measuring the retardation of wave plates (including the order of retardation) is presented. Two beams with the same polarization directions are introduced after a collimated white-light passes through the polarization interference system. Then the two beams are respectively reflected by two plane mirrors of the Michelson interferometer. As the moving mirror driven with piezoelectric transducer (PZT) scans vertically, three white-light interference packets are formed and are captured by a CCD camera. The retardation of wave plates can be calculated by the optical-path difference between the central packet and side packet. A multiple-order wave plate is tested by the white-light interference vertical scanning method, and the measured retardation (4268.1 nm) coincides with the that (4269.9 nm) measured by spectroscopic scanning method. |
| Keywords: | optical measurement wave plate retardation Michelson interferometer polarization interference white-light interference vertical scanning |
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