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细胞自动机及其在数字VLSI测试中的应用
引用本文:罗刚,洪洁. 细胞自动机及其在数字VLSI测试中的应用[J]. 四川大学学报(工程科学版), 2004, 36(4): 87-89,94
作者姓名:罗刚  洪洁
作者单位:成都电子机械高等专科学校,四川 成都610031
摘    要:以尽可能短的测试序列长度对被测电路达到较高的故障覆盖率为目标,基于细胞自动机的基本原理和分类,以及在超大规模集成电路伪随机测试中用作伪随机数发生器的一维线性混合型最大序列长度细胞自动机的结构和实现,利用m序列的移位可加性,分析了为细胞自动机阵列设计移相器以减小其生成位流互相关性的快速算法和实现,提供了一种低硬件开销的多扫描链配置方法,对标准电路的实验证明该方法具有较低的计算复杂度,可以缩短伪随机测试长度。

关 键 词:细胞自动机 m序列 集成电路测试
文章编号:1009-3087(2004)04-0087-03

Celluar Automata and Test Application for Digital VLSI
LUO Gang,HONG Jie. Celluar Automata and Test Application for Digital VLSI[J]. Journal of Sichuan University (Engineering Science Edition), 2004, 36(4): 87-89,94
Authors:LUO Gang  HONG Jie
Abstract:This paper aims at higher fault coverage for circuits under test with shorter test sequence as far as possible. Based on the Celluar Automata(CA) and its principle, classification,implementation structure of one dimension linear hybrid Celluar Automata with maximal sequence length and the application in pseudorandom test of very large scale integrated circuits, in virtue of the shift-additivity property of m sequence,the fast algorithm and implementation to alleviate the correlation of bit streams generated by Celluar Automata array are analyzed due to usage of programmable phase shifters. Configuration scheme of multiple scan chain with less hardware overhead is given.Experiments on Benchmark Circuits proves that the method in this paper has property with lower calculation complexity and can shorten the test length in pseudorandom test.
Keywords:Cellular Automata(CA)  m sequence  test of integrated circuits
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