| 工程表面粗糙度两用测量系统 |
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| 引用本文： | 谢峰,李建林,谢铁邦,李柱.工程表面粗糙度两用测量系统[J].工具技术,1999,33(4):28-30. |
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| 作者姓名： | 谢峰 李建林 谢铁邦 李柱 |
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| 作者单位： | 华中理工大学机械学院,430074 |
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| 摘 要： | 介绍了一种新型工程表面粗糙度两用测量系统的设计原理、仪器结构及测试结果。该系统可采用接触法和非接触法两种测量方式，接触法测量范围达±１００μｍ，最小分辨率为０．００５μｍ；非接触法测量范围达±２５０μｍ，最小分辨率为０．０１μｍ。
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| 关 键 词： | 表面粗糙度 接触测量法 聚焦探测法 |
Synthesis Measuring System for Engineering Surface Roughness |
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| Xie Feng,et al.Synthesis Measuring System for Engineering Surface Roughness[J].Tool Engineering(The Magazine for Cutting & Measuring Engineering),1999,33(4):28-30. |
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| Authors: | Xie Feng et al |
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| Affiliation: | Xie Feng et al |
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| Abstract: | The principle,structure and experiment results of a surface roughness synthesis measuring system are introduced.The system can be operated by contact or non contact measuring method.The maximum vertical measuring range by the contact method can reach ±100μm with a minimum resolution of 0.005μm and that by the non contact method can reach ±250μm with a minimum resolution of 0.01μm. |
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| Keywords: | surface roughness contact measuring method focus measuring method |
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