Microwave thickness measurement of lossy layered dielectric slabs using incoherent reflectivity |
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Authors: | S Bakhtiari R Zoughi |
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Affiliation: | (1) Department of Electrical Engineering, Colorado State University, 80523 Ft. Collins, CO, USA |
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Abstract: | Radiative transfer theory is used to calculate the incoherent effective reflectivity ( e) for a multilayer lossy dielectric medium backed by a conducting plate. The theoretical results of this formulation are compared with that of the coherent approach. Several test cases are presented to show the characteristics of e as a function of thickness, and dielectric constant of the dielectric layers, and frequency. The results can ultimately be used in nondestructive dielectric thickness measurement. |
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