Performance comparison between on-line sensors and control charts in manufacturing process monitoring |
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| Authors: | KWEI TANG WILLIAM W. WILLIAMS WUSHONG JWO LINGUO GONG |
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| Affiliation: | a Department of Information Systems and Decision Sciences, Louisiana State University, Baton Rouge, LA, USAb Department of Business Education, National Changhwa University of Education, Changhwa, Taiwan, Republic of Chinac Silberman School of Business, Fairleigh Dickinson University, Madison, NJ, USA |
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| Abstract: | The rapid evolution of sensor technology, using techniques such as lasers, machine vision and pattern recognition, provides the potential to greatly improve the Statistical Process Control (SPC) method for monitoring manufacturing processes. This paper studies the method of using on-line sensors to monitor manufacturing processes and compares that method with the control chart method, a widely used SPC tool. Two separate economic models are formulated for using either a sensor or a control chart to monitor a manufacturing process. Then, the two models are compared in a sensitivity analysis with lespect to several process parameters. |
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