Availability analysis of a two-unit (dissimilar) parallel system with inspection and bivariate exponential life times |
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| Authors: | LR Goel Rakesh Gupta SK Singh |
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| Affiliation: | Department of Statistics, Institute of Advanced Studies, Meerut University, Meerut-250005, India;Department of Statistics, U.P. College, Varanasi-2, India |
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| Abstract: | This paper investigates a two-units (non-identical) parallel system. Inspection is required to detect a failed unit but not the system with both failed units. The life time distribution of each unit is bivariate exponential (BVE) while the other distributions (i.e. repair, inspection and interinspection time) are arbitrary. Various state probabilities along with steady-state characteristics of the system are investigated. |
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