|
|||||
|
|
| Quantification of trace amounts of impurities in high purity cobalt by high resolution inductively coupled plasma mass spectrometry | |
| 引用本文： | XIE Hualin HUANG Kelong NIE Xidu TANG Yougen. Quantification of trace amounts of impurities in high purity cobalt by high resolution inductively coupled plasma mass spectrometry[J]. 稀有金属(英文版), 2007, 26(3): 286-291. DOI: 10.1016/S1001-0521(07)60216-2 |
| 作者姓名： | XIE Hualin HUANG Kelong NIE Xidu TANG Yougen |
| 作者单位： | XIE Hualin1，2)，HUANG Kelong1)，NIE Xidu2)，and TANG Yougen1) 1) School of Chemistry and Chemical Engineering，Central South University，Changsha 410083，China 2) Department of Chemistry，Hunan Institute of Technology，Hengyang 421008，China |
| 摘 要： | An analytical method using high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS) for rapid simultaneous determination of 24 elements (Be, Mg, Al, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, Ge, As, Se, Mo, Ag, Cd, Sn, Sb, Ba, Pt, Au, and Pb) in high purity cobalt was described. Sample digestions were performed in closed microwave vessels using HNO3 and HCl. The matrix effects because of the presence of excess HCl and Co were evaluated. The usefulness of high mass resolution for overcoming some spectral interference was demonstrated. The optimum conditions for the deter- mination were tested and discussed. The standard addition method was employed for quantitative analysis. The detection limits were 0.016-1.50 μg?g?1, the recovery ratios were 92.2%-111.2%, and the RSD was less than 3.6%. The method was accurate, quick, and convenient. It was applied to the determination of trace impurities in high purity cobalt with satisfactory results. |
| 关 键 词： | 高纯度钴 等离子体 光谱测定术 杂质跟踪 分辨率 |
| 收稿时间： | 2006-03-13 |
| 修稿时间： | 2006-03-13 |
Quantification of trace amounts of impurities in high purity cobalt by high resolution inductively coupled plasma mass spectrometry |
|
| XIE Hualin,HUANG Kelong,NIE Xidu,TANG Yougen. Quantification of trace amounts of impurities in high purity cobalt by high resolution inductively coupled plasma mass spectrometry[J]. Rare Metals, 2007, 26(3): 286-291. DOI: 10.1016/S1001-0521(07)60216-2 | |
| Authors: | XIE Hualin HUANG Kelong NIE Xidu TANG Yougen |
| Affiliation: | 1. School of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China;Department of Chemistry, Hunan Institute of Technology, Hengyang 421008, China 2. School of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China 3. Department of Chemistry, Hunan Institute of Technology, Hengyang 421008, China |
| Abstract: | An analytical method using high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS) for rapid simultaneous determination of 24 elements (Be, Mg, Al, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Ga, Ge, As, Se, Mo, Ag, Cd, Sn,Sb, Ba, Pt, Au, and Pb) in high purity cobalt was described. Sample digestions were performed in closed microwave vessels using HNO3 and HCl. The matrix effects because of the presence of excess HCl and Co were evaluated. The usefulness of high mass resolution for overcoming some spectral interference was demonstrated. The optimum conditions for the determination were tested and discussed. The standard addition method was employed for quantitative analysis. The detection limits were 0.016-1.50 μg.g-1, the recovery ratios were 92.2%-111.2%, and the RSD was less than 3.6%. The method was accurate, quick, and convenient. It was applied to the determination of trace impurities in high purity cobalt with satisfactory results. |
| Keywords: | high resolution inductively coupled plasma mass spectrometry high purity cobalt trace impurities matrix effect standard addition method |
| 本文献已被 CNKI 维普 万方数据 ScienceDirect 等数据库收录！ | |