| Abstract: | Some aspects of the variogram method used for characterizing the surface texture through scanning electron microscopy images are discussed. The sample case, which presents periodicity in some scale, is extensively discussed. The variogram application is studied for characterizing also the region in which the information attainment about the fractal dimension is obstructed by the presence of the minimum in the variogram due to the above-mentioned periodicity. The use of an invariant parameter at rotations is proposed to characterize the surface texture in such a region. |
