Floating gate EEPROM as EOS indicators during wafer-level GMRprocessing |
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Authors: | Granstrom E Cermak R Tesarek P Tabat N |
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Affiliation: | Seagate Technol., Bloomington, MN; |
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Abstract: | Potentially damaging charging currents and voltages in wafer-level giant magnetoresistance (GMR) plasma processing tools have been measured using floating gate EEPROM (FG-EEPROM) monitor wafers. Although FG-EEPROM monitors have been used as semiconductor process monitors, this report demonstrates their use in electrostatic discharge (ESD)-sensitive GMR head production. Use of FG-EEPROM monitors allows quantification of plasma-induced EOS voltages and currents, and can be used in optimizing process tool EOS performance, as is demonstrated in a case study on an ion mill |
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