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Investigation of layered structure SAW devices fabricated using low temperature grown AlN thin film on GaN/sapphire
Authors:Lin Hui-Feng  Wu Chun-Te  Chien Wei-Cheng  Chen Sheng-Wen  Kao Hui-Ling  Chyi Jen-Inn  Chen Jyh-Shin
Abstract:Epitaxial AlN films have been grown on GaN/sapphire using helicon sputtering at 300 degrees C. The surface acoustic wave (SAW) filters fabricated on AlN/GaN/sapphire exhibit more superior characteristics than those made on GaN/sapphire. This composite structure of AlN on GaN may bring about the development of high-frequency components, which integrate and use their semiconducting, optoelectronic, and piezoelectric properties.
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